Author Info
Name
Affiliation
Papers
M. NAFRÍA
Dept. Enginyeria Electrònica, Universitat Autònoma de Barcelona, 08193 Bellaterra, Spain
1
Collaborators
Citations 
PageRank 
2
1
0.45
Referers 
Referees 
References 
2
0
0
Title
Citations
PageRank
Year
Oxide conductivity increase during the progressive-breakdown of SiO2 gate oxides observed with C-AFM10.452003