Author Info
Name
Affiliation
Papers
YI-LUNG CHENG
national chi nan university
2
Collaborators
Citations 
PageRank 
6
1
0.72
Referers 
Referees 
References 
6
4
2
Title
Citations
PageRank
Year
Thickness dependence on electrical and reliability properties for dense and porous low dielectric constant materials10.382015
Electrical and reliability performance of atomic layer deposition HfO2 capping layer on porous low dielectric constant materials00.342015