Author Info
Name
Affiliation
Papers
W. M. LINDERMEIR
Institute of Electronic Design Automation, Technical University of Munich, Arcisstr. 21, 80333 Munich, Germany
2
Collaborators
Citations 
PageRank 
3
33
2.76
Referers 
Referees 
References 
69
49
30
Title
Citations
PageRank
Year
Analog testing by characteristic observation inference221.581999
Analog test design with IDD measurements for the detection of parametric and catastrophic faults111.181998