Name
Title | ||
|---|---|---|
Analog test design with IDD measurements for the detection of parametric and catastrophic faults |
Abstract | ||
|---|---|---|
Earlier approaches dealt with the detection of catastrophic faults based on IDD monitoring. Consideration of the more subtle parametric faults and the ADC quantization noise, however, is essential for high-quality analog testing. The paper presents a new design method for analog test of parametric and catastrophic faults by IDD monitoring. ADC quantization noise is systematically considered throughout the method. Results prove its effectiveness. |
Year | DOI | Venue |
|---|---|---|
1998 | 10.1109/DATE.1998.655953 | Paris |
Keywords | DocType | ISBN |
new design method,analog test,high-quality analog testing,analog test design,idd monitoring,adc quantization noise,subtle parametric fault,idd measurement,catastrophic fault,design method,fault model,noise measurement,fault detection,quantization noise,discriminant analysis,fault coverage | Conference | 0-8186-8359-7 |
Citations | PageRank | References |
11 | 1.18 | 8 |
Authors | ||
3 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| W. M. Lindermeir | 1 | 33 | 2.76 |
| T. J. Vogels | 2 | 11 | 1.18 |
| Helmut E. Graeb | 3 | 269 | 36.22 |