Author Info
Name
Affiliation
Papers
YOON HUH
Global Technology Leader
1
Collaborators
Citations 
PageRank 
6
1
0.38
Referers 
Referees 
References 
3
0
0
Title
Citations
PageRank
Year
ESD-Induced Internal Core Device Failure: New Failure Modes in System-on-Chip (SoC) Designs, invited10.382005