Author Info
Name
Affiliation
Papers
MIETEK BAKOWSKI
Department of Miroelectronics and Information Technology, Royal Institute of Technology, Isafjordsgatan 22, P.O. Box Electrum 229, SE 164-40 Kista, Sweden
3
Collaborators
Citations 
PageRank 
14
8
1.98
Referers 
Referees 
References 
34
48
12
Title
Citations
PageRank
Year
Comparison of Thermal Stress During Short-Circuit in Different Types of 1.2-kV SiC Transistors Based on Experiments and Simulations00.342021
Short-Circuit Protection Circuits For Silicon-Carbide Power Transistors81.302016
Characterisation of the Al2O3 films deposited by ultrasonic spray pyrolysis and atomic layer deposition methods for passivation of 4H–SiC devices00.342006