Author Info
Name
Affiliation
Papers
P. J. ZAMPARDI
Rockwell Inst. Sci. Center, Thousand Oaks, CA, USA
2
Collaborators
Citations 
PageRank 
8
0
0.68
Referers 
Referees 
References 
0
11
1
Title
Citations
PageRank
Year
Determination of safe reliability region over temperature and current density for through wafer vias.00.342017
A packaged broad-band monolithic variable gain amplifier implemented in AlGaAs/GaAs HBT technology00.341996