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Fast and Accurate Automatic Defect CLuster Extraction for Semiconductor Wafers | 1 | 0.36 | 2010 |
East-Bearing Measurement With A Single Ultrasonic Transducer | 6 | 0.70 | 1998 |
An autonomous robot navigation system - integrating environmental mapping, path planning, localisation and motion control. | 5 | 1.05 | 1993 |
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Three way branching self consistency checking of hardware and software | 0 | 0.34 | 1986 |