Name
Abstract | ||
|---|---|---|
Reduction in integrated circuit (IC) half technology, which will no longer be sustainable by traditional fault isolation and failure analysis techniques. There is an urgent need for diagnostic software tools with (which manifest as clusters) observed from manufacturing defects can be traced back to a specific process, equipment or technology, a novel data mining algorithm defects from test data logs. This algorithm and provides accurate detection of 99%. |
Year | DOI | Venue |
|---|---|---|
2010 | 10.1109/DELTA.2010.66 | DELTA |
Keywords | Field | DocType |
urgent need,algorithm defect,novel data,traditional fault isolation,semiconductor wafers,test data log,failure analysis technique,diagnostic software tool,cluster extraction,accurate detection,integrated circuit,accurate automatic defect,specific process,data mining,algorithm design and analysis,failure analysis,clustering algorithms,fault isolation,segmentation,clusters,integrated circuits,approximation algorithms | Approximation algorithm,Algorithm design,Fault detection and isolation,Computer science,Electronic engineering,Software,Test data,Cluster analysis,Failure analysis,Integrated circuit | Conference |
Citations | PageRank | References |
1 | 0.36 | 5 |
Authors | ||
6 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Melanie Po-Leen Ooi | 1 | 70 | 18.35 |
| Chris Chan | 2 | 1 | 0.36 |
| Wey Jean Tee | 3 | 1 | 0.36 |
| Ye Chow Kuang | 4 | 72 | 19.81 |
| Lindsay Kleeman | 5 | 18 | 5.08 |
| Serge Demidenko | 6 | 47 | 7.78 |