Name
Title | Citations | PageRank | Year |
|---|---|---|---|
| New on-Chip DFT and ATE Features for Efficient Embedded Memory Test | 0 | 0.34 | 2006 |
| Compression Mode Diagnosis Enables High Volume Monitoring Diagnosis Flow | 22 | 1.42 | 2005 |
| Outsourcing test without standards? | 0 | 0.34 | 2002 |
| Tutorial Statement | 0 | 0.34 | 2000 |
| Cost Effective Testing of Systems on Silicon Areas for Optimization | 0 | 0.34 | 1999 |