Author Info
Name
Affiliation
Papers
ROYSTEIN OLIVEIRA
Rutgers University, USA
2
Collaborators
Citations 
PageRank 
3
12
1.33
Referers 
Referees 
References 
32
25
16
Title
Citations
PageRank
Year
A Robust Architecture for Flip-Flops Tolerant to Soft-Errors and Transients from Combinational Circuits10.372008
A TMR Scheme for SEU Mitigation in Scan Flip-Flops110.952007