Author Info
Name
Affiliation
Papers
MICHAEL MEEDER
RF Micro Devices, 7628 Thorndike Rd., Greensboro, NC 27409, USA
4
Collaborators
Citations 
PageRank 
8
2
1.93
Referers 
Referees 
References 
7
6
2
Title
Citations
PageRank
Year
Determination of safe reliability region over temperature and current density for through wafer vias.00.342017
Process reliability screening in situ.00.342014
Application of Machine Model ESD tester to high volume capacitor reliability testing00.342011
Determining constant voltage lifetimes for silicon nitride capacitors in a GaAs IC process by a step stress method20.912005