Name
Title | Citations | PageRank | Year |
|---|---|---|---|
| Deriving Feature Fail Rate from Silicon Volume Diagnostics Data. | 0 | 0.34 | 2013 |
| Design-for-Test Techniques for SoC Designs (Tutorial Abstract) | 0 | 0.34 | 2002 |
| Embedded Deterministic Test for Low-Cost Manufacturing Test | 247 | 13.26 | 2002 |