Josep Altet - Citegraph

Author Info

Name	Affiliation	Papers
JOSEP ALTET	Department of Electronic Engineering, Universitat Politècnica de Catalunya, Barcelona, Spain 08034	30
Collaborators	Citations	PageRank
58	93	17.61
Referers	Referees	References
159	274	169

Search Limit

100274

Publications (30 rows)

Collaborators (58 rows)

Referers (100 rows)

Referees (100 rows)

Title	Citations	PageRank	Year
On the Use of Built-In Temperature Sensors to Monitor Aging in RF Circuits	0	0.34	2019
Differential Temperature Sensors: Review of Applications in the Test and Characterization of Circuits, Usage and Design Methodology	0	0.34	2019
Output Power and Gain Monitoring in RF CMOS Class A Power Amplifiers by Thermal Imaging	0	0.34	2019
On-Chip Thermal Testing Using MOSFETs in Weak Inversion	2	0.42	2015
Electro-thermal characterization of a differential temperature sensor in a 65 nm CMOS IC: Applications to gain monitoring in RF amplifiers.	0	0.34	2014
Defect-oriented non-intrusive RF test using on-chip temperature sensors	0	0.34	2013
On line monitoring of RF power amplifiers with embedded temperature sensors	1	0.38	2012
DC temperature measurements for power gain monitoring in RF power amplifiers	1	0.35	2012
On the Use of Static Temperature Measurements as Process Variation Observable.	2	0.48	2012
Design of a fully integrated CMOS self-testable RF power amplifier using a thermal sensor	0	0.34	2012
Electro-thermal coupling analysis methodology for RF circuits	4	0.59	2012
Testing RF circuits with true non-intrusive built-in sensors	2	0.44	2012
Survey of Robustness Enhancement Techniques for Wireless Systems-on-a-Chip and Study of Temperature as Observable for Process Variations	3	0.47	2011
Electrothermal Design Procedure to Observe RF Circuit Power and Linearity Characteristics With a Homodyne Differential Temperature Sensor.	11	0.81	2011
Thermal coupling in ICs: Applications to the test and characterization of analogue and RF circuits	0	0.34	2010
Non-invasive RF built-in testing using on-chip temperature sensors	0	0.34	2009
Using Temperature as Observable of the Frequency Response of RF CMOS Amplifiers	2	0.63	2008
Electrical characterization of analogue and RF integrated circuits by thermal measurements	4	0.53	2007
Dynamic Surface Temperature Measurements in ICs	12	1.66	2006
Observation of high-frequency analog/RF electrical circuit characteristics by on-chip thermal measurements	1	0.46	2006
Sensing temperature in CMOS circuits for Thermal Testing	4	0.63	2004
Applications of temperature phase measurements to IC testing	3	1.00	2004
Thermal Testing of Analogue Integrated Circuits: A Case Study	0	0.34	2003
Structural RFIC device testing through built-in thermal monitoring	4	0.47	2003
Thermal coupling in integrated circuits: application to thermal testing	20	2.01	2001
CMOS Differential and Absolute Thermal Sensors	7	0.77	2001
Thermal Testing: Fault Location Strategies	0	0.34	2000
Differential Thermal Testing: An Approach to its Feasibility	4	0.84	1999
Differential sensing strategy for dynamic thermal testing of ICs	6	0.95	1997
Analysis of the feasibility of dynamic thermal testing in digital circuits	0	0.34	1997