Author Info
Name
Affiliation
Papers
CHRISTIAN SCHLÜNDER
Infineon Technologies AG, D-85579 Munich, Germany
6
Collaborators
Citations 
PageRank 
23
5
2.28
Referers 
Referees 
References 
26
32
10
Title
Citations
PageRank
Year
From Device Aging Physics to Automated Circuit Reliability Sign Off10.352019
Fast acquisition of activation energy maps using temperature ramps for lifetime modeling of BTI00.342018
NBTI: Experimental investigation, physical modelling, circuit aging simulations and verification.00.342018
Degradation and recovery of variability due to BTI.00.342016
New insights on the PBTI phenomena in SiON pMOSFETs.00.342012
Effects of inhomogeneous negative bias temperature stress on p-channel MOSFETs of analog and RF circuits40.572005