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ROLF-PETER VOLLERTSEN
Author Info
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Name
Affiliation
Papers
ROLF-PETER VOLLERTSEN
Infineon Technologies NAC, 1000 River Street, Essex Junction, VT 05452, USA
6
Collaborators
Citations
PageRank
12
3
2.52
Referers
Referees
References
15
22
8
Publications (6 rows)
Collaborators (12 rows)
Referers (15 rows)
Referees (22 rows)
Title
Citations
PageRank
Year
Fast wafer level reliability monitoring as a tool to achieve automotive quality for a wafer process.
0
0.34
2016
Is the power-law model applicable beyond the direct tunneling regime?
2
0.73
2005
The TDDB power-law model—Physics and experimental evidences
0
0.34
2005
Fast wafer level reliability: methods and experiences
0
0.34
2004
An introduction to fast wafer level reliability monitoring for integrated circuit mass production
1
0.43
2004
A new empirical extrapolation method for time-dependent dielectric breakdown reliability projections of thin SiO2 and nitride–oxide dielectrics
0
0.34
2002
1