Name
Title | Citations | PageRank | Year |
|---|---|---|---|
| Hot hole-induced device degradation by drain junction reverse current. | 0 | 0.34 | 2013 |
| The BMAP/SM/1 retrial queue with controllable operation modes | 14 | 2.28 | 2001 |
| The M/G/1 retrial queue with Bernoulli schedule | 23 | 6.77 | 1990 |
| Retrial queues with server subject to breakdown and repairs | 36 | 2.72 | 1990 |