| Investigation on X-ray irradiation on nanoscale nitride based charge trapping flash memory devices. | 0 | 0.34 | 2017 |
| Investigation on the origin of the anomalous tail bits on nitrided charge trap flash memory. | 0 | 0.34 | 2015 |
| Threshold voltage instability of nanoscale charge trapping non-volatile memory at steady phase. | 0 | 0.34 | 2014 |
