Name
Affiliation
Papers
DU-MING TSAI
Department of Industrial Engineering and Management, Yuan-Ze University, 135 Yuan-Tung Road, Nei-Li, Tao-Yuan 32026, Taiwan, ROC
67
Collaborators
Citations 
PageRank 
59
970
68.17
Referers 
Referees 
References 
2154
1239
1009
Search Limit
1001000
Title
Citations
PageRank
Year
Fault Diagnosis of Wafer Acceptance Test and Chip Probing Between Front-End-of-Line and Back-End-of-Line Processes00.342022
Key Feature Identification for Monitoring Wafer-to-Wafer Variation in Semiconductor Manufacturing00.342022
Autoencoder-based anomaly detection for surface defect inspection00.342021
Data-Driven Approach for Fault Detection and Diagnostic in Semiconductor Manufacturing40.432020
Machine Vision-Based Positioning and Inspection Using Expectation-Maximization Technique.10.402017
Coffee plantation area recognition in satellite images using Fourier transform.10.412017
Optical flow-motion history image (OF-MHI) for action recognition160.592015
Defect detection in multi-crystal solar cells using clustering with uniformity measures20.422015
Surface defect detection in low-contrast images using basis image representation00.342015
A real-time ICA-based activity recognition in video sequences.00.342013
Dual-mode Detection for Foreground Segmentation in Low-contrast Video Images.00.342013
Defect Detection in Solar Modules Using ICA Basis Images.40.522013
A Template Reconstruction Scheme For Moving Object Detection From A Mobile Robot00.342013
Wavelet-based defect detection in solar wafer images with inhomogeneous texture180.792012
A fast regularity measure for surface defect detection80.572012
A Shift-Tolerant Dissimilarity Measure for Surface Defect Detection190.852012
ICA-based Action Recognition for Human-computer Interaction in Disturbed Backgrounds.00.342012
Defect Inspection in Low-Contrast LCD Images Using Hough Transform-Based Nonstationary Line Detection231.182011
Mean Shift-Based Defect Detection in Multicrystalline Solar Wafer Surfaces201.192011
Fuzzy C-means based clustering for linearly and nonlinearly separable data381.412011
Surface Defect Detection Of 3d Objects Using Robot Vision00.342011
Low-contrast surface inspection of mura defects in liquid crystal displays using optical flow-based motion analysis50.482011
A Generalized Anisotropic Diffusion for Defect Detection in Low-Contrast Surfaces00.342010
A macro-observation scheme for abnormal event detection in daily-life video sequences20.392010
Anisotropic diffusion with generalized diffusion coefficient function for defect detection in low-contrast surface images70.642010
A Macro-observation Approach of Intelligence Video Surveillance for Real-Time Unusual Event Detection00.342010
An improved anisotropic diffusion model for detail- and edge-preserving smoothing371.022010
Anisotropic Diffusion-Based Detail-Preserving Smoothing For Image Restoration30.382010
Micro-crack inspection in heterogeneously textured solar wafers using anisotropic diffusion121.042010
Defect detection of uneven brightness in low-contrast images using basis image representation30.422010
1D-based defect detection in patterned TFT-LCD panels using characteristic fractal dimension and correlations60.712009
Independent component analysis-based background subtraction for indoor surveillance.842.422009
Motion detection using Fourier image reconstruction60.652008
Independent component analysis-based defect detection in patterned liquid crystal display surfaces130.902008
An anisotropic diffusion-based defect detection for low-contrast glass substrates140.862008
Defect detection in periodically patterned surfaces using independent component analysis70.902008
Defect detection in inhomogeneously textured sputtered surfaces using 3D Fourier image reconstruction20.412007
Defect detection in low-contrast glass substrates using anisotropic diffusion00.342006
Independent component analysis based filter design for defect detection in low-contrast textured images181.042006
An independent component analysis-based filter design for defect detection in low-contrast surface images171.032006
Astronomical image restoration using an improved anisotropic diffusion90.572006
An eigenvalue-based similarity measure and its application in defect detection110.792005
An anisotropic diffusion-based defect detection for sputtered surfaces with inhomogeneous textures90.622005
A quantile-quantile plot based pattern matching for defect detection110.962005
Optimal multi-thresholding using a hybrid optimization approach482.452005
Fast normalized cross correlation for defect detection582.882003
Defect detection in textured surfaces using color ring-projection correlation60.592003
Automatic band selection for wavelet reconstruction in the application of defect detection150.852003
The evaluation of normalized cross correlations for defect detection291.782003
Automated surface inspection for statistical textures421.762003
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