Name
Abstract | ||
|---|---|---|
This paper presents an automated visual inspection scheme for multicrystalline solar wafers using the mean-shift technique. The surface quality of a solar wafer critically determines the conversion efficiency of the solar cell. A multicrystalline solar wafer contains random grain structures and results in a heterogeneous texture in the sensed image, which makes the defect detection task extremely ... |
Year | DOI | Venue |
|---|---|---|
2011 | 10.1109/TII.2010.2092783 | IEEE Transactions on Industrial Informatics |
Keywords | Field | DocType |
Image edge detection,Entropy,Inspection,Pixel,Kernel,Surface texture,Bandwidth | Computer science,Edge detection,Real-time computing,Artificial intelligence,Kernel density estimation,Wafer,Computer vision,Image texture,Optics,Solar cell,Smoothing,Pixel,Mean-shift | Journal |
Volume | Issue | ISSN |
7 | 1 | 1551-3203 |
Citations | PageRank | References |
20 | 1.19 | 33 |
Authors | ||
2 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Du-Ming Tsai | 1 | 970 | 68.17 |
| Jie-Yu Luo | 2 | 20 | 1.19 |