Author Info
Name
Affiliation
Papers
UIN CHUNG
Semiconductor R&D Center, Samsung Electronics Co. Ltd. San#24, Nongseo-Ree, Kiheung-Eup, Yongin-City, Kyonggi-Do, 449-711, South Korea
2
Collaborators
Citations 
PageRank 
9
1
0.78
Referers 
Referees 
References 
7
0
0
Title
Citations
PageRank
Year
Elimination of surface state induced edge transistors in high voltage NMOSFETs for flash memory devices10.442005
Electrical analysis of DRAM cell transistors for the root-cause addressing of the tRDL time-delay failure00.342003