Name
Title | Citations | PageRank | Year |
|---|---|---|---|
| Extraction of defect density and size distributions from wafer sort test results | 5 | 0.59 | 2006 |
| Benchmarking Diagnosis Algorithms With a Diverse Set of IC Deformations | 7 | 0.57 | 2004 |
| Deformations of ic structure in test and yield learning | 23 | 1.41 | 2003 |