Author Info
Name
Affiliation
Papers
S. I. CHAN
Reliability Physics Research Center, Korea Electronic Technology Institute, Seongnam, Republic of Korea
3
Collaborators
Citations 
PageRank 
8
7
1.55
Referers 
Referees 
References 
21
45
10
Title
Citations
PageRank
Year
Reliability improvement of automotive electronics based on environmental stress screen methodology.20.372013
Conclusion of the accelerated stress conditions affecting phosphor-converted LEDs using the fractional factorial design method.10.482013
Accelerated life test of high power white light emitting diodes based on package failure mechanisms.40.702011