Name
Title | ||
|---|---|---|
Reliability improvement of automotive electronics based on environmental stress screen methodology. |
Abstract | ||
|---|---|---|
•We evaluated the effectiveness of the standard ESS for detecting fault latency.•To carry out ESS experiment, artificially fault injected specimens were prepared.•The standard ESS method could not screen out the fault latency.•An ESS condition, which can detect fault latency in ICs, must be developed. |
Year | DOI | Venue |
|---|---|---|
2013 | 10.1016/j.microrel.2013.07.037 | Microelectronics Reliability |
DocType | Volume | Issue |
Journal | 53 | 9 |
ISSN | Citations | PageRank |
0026-2714 | 2 | 0.37 |
References | Authors | |
1 | 3 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| S. I. Chan | 1 | 7 | 1.55 |
| J. H. Kang | 2 | 4 | 1.23 |
| Joong Soon Jang | 3 | 21 | 4.21 |