Author Info
Name
Affiliation
Papers
YU BI
Delft Univ Technol, Delft, Netherlands
2
Collaborators
Citations 
PageRank 
4
1
0.72
Referers 
Referees 
References 
4
38
14
Title
Citations
PageRank
Year
Efficient sensitivity-based capacitance modeling for systematic and random geometric variations10.382011
Enhanced Sensitivity Computation For Bem Based Capacitance Extraction Using The Schur Complement Technique00.342011