Name
Title | ||
|---|---|---|
Enhanced Sensitivity Computation For Bem Based Capacitance Extraction Using The Schur Complement Technique |
Abstract | ||
|---|---|---|
This paper presents a useful extension for an existing algorithm of capacitance sensitivity computation with respect to multiple geometric variations. The existing algorithm is applicable for BEM-based capacitance extraction tools and provides good accuracy results. Using the Schur complement technique, the extended algorithm can achieve an even better accuracy at a modest increase of computational cost. With such extension, the enhanced algorithm becomes more flexible in the sense that it is able to provide different solutions for different application requirements: high efficiency with good accuracy or high accuracy with modest time cost. |
Year | DOI | Venue |
|---|---|---|
2011 | 10.1109/CICC.2011.6055331 | 2011 IEEE CUSTOM INTEGRATED CIRCUITS CONFERENCE (CICC) |
Keywords | Field | DocType |
schur complement,geometry | Capacitance,Computer science,Electronic engineering,Schur complement,Computation | Conference |
Citations | PageRank | References |
0 | 0.34 | 5 |
Authors | ||
3 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Yu Bi | 1 | 1 | 0.72 |
| Simon de Graaf | 2 | 0 | 0.34 |
| Nick van der Meijs | 3 | 30 | 7.49 |