Antonio Rubio - Citegraph

Author Info

Name	Affiliation	Papers
ANTONIO RUBIO	Katholieke Univ Leuven, Dept Elect Engn, Louvain, Belgium	26
Collaborators	Citations	PageRank
63	212	24.60
Referers	Referees	References
478	295	143

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100478

Publications (26 rows)

Collaborators (63 rows)

Referers (100 rows)

Referees (100 rows)

Title	Citations	PageRank	Year
Systematic and random variability analysis of two different 6T-SRAM layout topologies	1	0.36	2013
A new compensation mechanism for environmental parameter fluctuations in CMOS digital ICs	3	0.47	2009
Using Temperature as Observable of the Frequency Response of RF CMOS Amplifiers	2	0.63	2008
High level spectral-based analysis of power consumption in DSPs systems	0	0.34	2006
Analytical and experimental verification of substrate noise spectrum for mixed-signal ICs	5	0.57	2006
Dynamic Surface Temperature Measurements in ICs	12	1.66	2006
Statistical voice activity detection using a multiple observation likelihood ratio test	51	2.50	2005
An investigation on the relation between digital circuitry characteristics and power supply noise spectrum in mixed-signal CMOS integrated circuits	2	0.39	2005
Asynchronous pulse logic cell for threshold logic and Boolean networks	0	0.34	2005
Sensing temperature in CMOS circuits for Thermal Testing	4	0.63	2004
A new Kullback-Leibler VAD for speech recognition in noise.	24	1.77	2004
Applications of temperature phase measurements to IC testing	3	1.00	2004
Structural RFIC device testing through built-in thermal monitoring	4	0.47	2003
Adaptable I/O pad circuit for multiple voltage units bus operation	0	0.34	2003
Noise Generation and Coupling Mechanisms in Deep-Submicron ICs	15	1.18	2002
Thermal coupling in integrated circuits: application to thermal testing	20	2.01	2001
Thermal Testing: Fault Location Strategies	0	0.34	2000
Experimental comparison of substrate noise coupling using different wafer types	13	1.95	1999
Differential Thermal Testing: An Approach to its Feasibility	4	0.84	1999
Substrate coupling evaluation in BiCMOS technology	5	1.38	1997
Differential sensing strategy for dynamic thermal testing of ICs	6	0.95	1997
A detailed analysis of CMOS SRAM's with gate oxide short defects	6	0.69	1997
Analysis of the feasibility of dynamic thermal testing in digital circuits	0	0.34	1997
Generating matrices for the discrete sine transforms	5	0.86	1996
A detailed analysis and electrical modeling of gate oxide shorts in MOS transistors	14	1.36	1996
A built-in quiescent current monitor for CMOS VLSI circuits	13	1.24	1995