Title
Analytical and experimental verification of substrate noise spectrum for mixed-signal ICs
Abstract
In this paper, the most relevant characteristics of the substrate noise spectrum for mixed-signal integrated circuits (ICs) are derived using a simple analytical model. These characteristics are related to parameters of the digital circuit, the package + printed circuit board parasitics, and other elements of the mixed-signal IC. The model used to derive the substrate noise spectral characteristics includes the statistical properties of the digital switching current waveform and the coupling transfer function between the digital power supply nodes and the substrate node of the victim circuitry. The results of the work are validated experimentally on a mixed-signal prototype
Year
DOI
Venue
2006
10.1109/TCSI.2006.879065
Circuits and Systems I: Regular Papers, IEEE Transactions
Keywords
Field
DocType
integrated circuit modelling,integrated circuit noise,mixed analogue-digital integrated circuits,system-on-chip,coupling transfer function,digital noise,digital switching current waveform,integrated circuit modeling,mixed signal integrated circuits,substrate noise spectrum,system-on-chip,Digital noise,integrated circuit (IC) modeling,mixed analog&#8211,digital circuits,substrate noise,system-on-a-chip (SoC)
Digital electronics,System on a chip,Waveform,Printed circuit board,Substrate coupling,Electronic engineering,Mixed-signal integrated circuit,Electrical engineering,Parasitic extraction,Integrated circuit,Mathematics
Journal
Volume
Issue
ISSN
53
8
1549-8328
Citations 
PageRank 
References 
5
0.57
8
Authors
4
Name
Order
Citations
PageRank
Mendez, M.A.150.57
Diego Mateo24310.97
Antonio Rubio321224.60
José Luis Vicedo González437646.29