Author Info
Name
Affiliation
Papers
R. FERNÁNDEZ
Corresponding author. Tel.: +34 93 581 4803; fax: +34 93 581 26 00.
4
Collaborators
Citations 
PageRank 
8
7
2.19
Referers 
Referees 
References 
18
18
4
Title
Citations
PageRank
Year
A Modified Charge Pumping Method for Measuring Interface States Up to the Ghz Range00.342009
Effect of oxide breakdown on RS latches20.692007
FinFET and MOSFET preliminary comparison of gate oxide reliability20.422006
Influence of oxide breakdown position and device aspect ratio on MOSFET’s output characteristics30.752005