Author Info
Name
Affiliation
Papers
MANI, M.
Dept. of Electr. & Comput. Eng., Texas Univ., Austin, TX, USA
1
Collaborators
Citations 
PageRank 
2
4
0.48
Referers 
Referees 
References 
15
55
21
Title
Citations
PageRank
Year
Statistical technology mapping for parametric yield40.482005