Author Info
Name
Affiliation
Papers
N. NANAWARE
Department of Electrical EngineeringIndian Institute of Technology BombayMumbai400076India
1
Collaborators
Citations 
PageRank 
4
8
1.42
Referers 
Referees 
References 
36
23
7
Title
Citations
PageRank
Year
A comprehensive modeling framework for gate stack process dependence of DC and AC NBTI in SiON and HKMG p-MOSFETs.81.422014