Author Info
Name
Affiliation
Papers
VICTOR M. VAN SANTEN
Karlsruhe Institute of Technology (KIT), Germany
19
Collaborators
Citations 
PageRank 
32
73
8.95
Referers 
Referees 
References 
128
250
95
Search Limit
100250
Title
Citations
PageRank
Year
On the Reliability of FeFET On-Chip Memory10.372022
Reliability-Driven Voltage Optimization for NCFET-based SRAM Memory Banks00.342021
Modeling emerging technologies using machine learning: challenges and opportunities10.342020
Impact of Self-Heating on Performance, Power and Reliability in FinFET Technology10.362020
On the Workload Dependence of Self-Heating in FinFET Circuits20.412020
NCFET to Rescue Technology Scaling - Opportunities and Challenges.00.342020
BTI and HCD Degradation in a Complete 32 × 64 bit SRAM Array – including Sense Amplifiers and Write Drivers – under Processor Activity10.362020
Reliability Challenges with Self-Heating and Aging in FinFET Technology10.382019
Modeling and Mitigating Time-Dependent Variability From the Physical Level to the Circuit Level30.482019
Modeling the Interdependences Between Voltage Fluctuation and BTI Aging10.422019
Modeling and Evaluating the Gate Length Dependence of BTI00.342019
Reliability Estimations of Large Circuits in Massively-Parallel GPU-SPICE00.342018
Estimating and optimizing BTI aging effects: from physics to CAD.20.412018
Reliability in Super- and Near-Threshold Computing: A Unified Model of RTN, BTI, and PV.40.522018
Interdependencies of Degradation Effects and Their Impact on Computing.50.582017
Designing guardbands for instantaneous aging effects.90.602016
Aging-Aware Voltage Scaling50.492016
Connecting the physical and application level towards grasping aging effects90.722015
Towards interdependencies of aging mechanisms281.162014