Author Info
Name
Affiliation
Papers
C. JUNGEMANN
Institute für Theoretische Elektrotechnik, RWTH Aachen, Germany
1
Collaborators
Citations 
PageRank 
8
0
0.34
Referers 
Referees 
References 
0
21
2
Title
Citations
PageRank
Year
An analytical approach for physical modeling of hot-carrier induced degradation.00.342011