Author Info
Name
Affiliation
Papers
YOLANDA T. HADEED
Harris Corp., Melbourne, FL, USA|c|
1
Collaborators
Citations 
PageRank 
1
0
0.34
Referers 
Referees 
References 
0
0
0
Title
Citations
PageRank
Year
The use of tolerance intervals in the characterization of semiconductor devices00.341990