Name
Title | Citations | PageRank | Year |
|---|---|---|---|
| Standard Uncertainty estimation on polynomial regression models | 1 | 0.38 | 2014 |
| Predictive Die-Level Reliability-Yield Modeling for Deep Sub-micron Devices | 1 | 0.38 | 2008 |
| Simulation and development of short transparent tests for RAM | 6 | 0.62 | 2001 |