Author Info
Name
Papers
Collaborators
HEISS, L.
2
8
Citations 
PageRank 
Referers 
4
0.88
14
Referees 
References 
11
5
Title
Citations
PageRank
Year
From an analytic NBTI device model to reliability assessment of complex digital circuits10.362014
Adaptive voltage scaling by in-situ delay monitoring for an image processing circuit30.522012