M. Meneghini - Citegraph

Author Info

Name	Affiliation	Papers
M. MENEGHINI	Department of Information Engineering, University of Padova, v. Gradenigo 6/B, I-35131 Padova, Italy	4
Collaborators	Citations	PageRank
22	23	10.17
Referers	Referees	References
97	16	5

Publications (4 rows)

Collaborators (22 rows)

Referers (97 rows)

Referees (16 rows)

Title	Citations	PageRank	Year
Evidence for temperature-dependent buffer-induced trapping in GaN-on-silicon power transistors	1	0.63	2015
Defect-related degradation of Deep-UV-LEDs	3	0.54	2010
High temperature electro-optical degradation of InGaN/GaN HBLEDs	12	3.20	2007
High brightness GaN LEDs degradation during dc and pulsed stress	7	5.81	2006

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