Author Info
Name
Affiliation
Papers
HAIROUD, S.
IMS, Univ. Bordeaux, Talence, France|c|
1
Collaborators
Citations 
PageRank 
3
1
0.47
Referers 
Referees 
References 
5
4
2
Title
Citations
PageRank
Year
Conducted immunity of three Op-Amps using the DPI measurement technique and VHDL-AMS modeling10.472013