Author Info
Name
Affiliation
Papers
NIKUNJ PATEL
Intel Corp, Log Technol Dev Qual & Reliabil, Hillsboro, OR 97124 USA
1
Collaborators
Citations 
PageRank 
3
0
0.34
Referers 
Referees 
References 
0
2
2
Title
Citations
PageRank
Year
Susceptibility of planar and 3D tri-gate technologies to muon-induced single event upsets00.342015