| NBTI: Experimental investigation, physical modelling, circuit aging simulations and verification. | 0 | 0.34 | 2018 |
| Characterization and modeling of charge trapping: From single defects to devices | 1 | 0.49 | 2014 |
| Mixture of negative bias temperature instability and hot-carrier driven threshold voltage degradation of 130 nm technology p-channel transistors. | 1 | 0.39 | 2014 |
