| Fast wafer level reliability monitoring as a tool to achieve automotive quality for a wafer process. | 0 | 0.34 | 2016 |
| Plasma process induced damage detection by fast wafer level reliability monitoring for automotive applications. | 0 | 0.34 | 2016 |
| Degradation and recovery of variability due to BTI. | 0 | 0.34 | 2016 |
