Author Info
Name
Affiliation
Papers
TOMOKI AONO
Dept. of Computer Science, Ehime University, Matsuyama-shi, Japan
1
Collaborators
Citations 
PageRank 
6
0
0.34
Referers 
Referees 
References 
0
24
7
Title
Citations
PageRank
Year
Capture-Pattern-Control to Address the Fault Detection Degradation Problem of Multi-cycle Test in Logic BIST00.342018