Author Info
Name
Affiliation
Papers
YOGESH S. CHAUCHAN
Indian Institute of Technology Kanpur (IITK), Kanpur, India
1
Collaborators
Citations 
PageRank 
4
0
0.34
Referers 
Referees 
References 
0
0
0
Title
Citations
PageRank
Year
Reliability-Driven Voltage Optimization for NCFET-based SRAM Memory Banks00.342021