Author Info
Name
Affiliation
Papers
YOSHIAKI DEGUCHI
Department of Electrical, Electronic, and Communication Engineering, Chuo University, Tokyo, Japan
4
Collaborators
Citations 
PageRank 
4
3
1.52
Referers 
Referees 
References 
12
167
8
Search Limit
100167
Title
Citations
PageRank
Year
3-D NAND Flash Value-Aware SSD: Error-Tolerant SSD Without ECCs for Image Recognition00.342019
Adaptive Artificial Neural Network-Coupled LDPC ECC as Universal Solution for 3-D and 2-D, Charge-Trap and Floating-Gate NAND Flash Memories10.382019
12× bit-error acceptable, 300× extended data-retention time, value-aware SSD with vertical 3D-TLC NAND flash memories for image recognition00.342017
Word-line batch Vth modulation of TLC NAND flash memories for both write-hot and cold data20.462017