Author Info
Name
Affiliation
Papers
WEI ZHOU
School of Electronic and Information Engineering, Harbin Institute of Technology, Shenzhen, China
1
Collaborators
Citations 
PageRank 
3
2
0.44
Referers 
Referees 
References 
6
0
0
Title
Citations
PageRank
Year
A New PUF Based Lock and Key Solution for Secure In-Field Testing of Cryptographic Chips20.442021