Name
Title | ||
|---|---|---|
A New PUF Based Lock and Key Solution for Secure In-Field Testing of Cryptographic Chips |
Abstract | ||
|---|---|---|
Scan-based side-channel attacks have become a new threat to cryptographic chips. Existing countermeasures require a secret test key to unlock the scan chain before in-field testing is allowed. However, test key disclosure poses tremendous risks to multiple crypto chips that share a common test key. We address this open problem of in-field testing by leveraging physical unclonable function (PUF) to... |
Year | DOI | Venue |
|---|---|---|
2021 | 10.1109/TETC.2019.2903387 | IEEE Transactions on Emerging Topics in Computing |
Keywords | DocType | Volume |
Testing,Integrated circuits,Encryption,Circuit faults | Journal | 9 |
Issue | ISSN | Citations |
2 | 2168-6750 | 2 |
PageRank | References | Authors |
0.44 | 0 | 4 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Aijiao Cui | 1 | 161 | 20.51 |
| Chip-Hong Chang | 2 | 1160 | 123.27 |
| WEI ZHOU | 3 | 2 | 0.44 |
| Yue Zheng | 4 | 70 | 10.70 |