| High-Speed Serial Embedded Deterministic Test for System-on-Chip Designs | 0 | 0.34 | 2014 |
| Isometric test compression with low toggling activity | 2 | 0.37 | 2014 |
| New test compression scheme based on low power BIST | 1 | 0.35 | 2013 |
| Fault Diagnosis in Memory BIST Environment with Non-march Tests | 2 | 0.41 | 2011 |
| Reduced ATE Interface for High Test Data Compression | 2 | 0.39 | 2011 |
| Embedded deterministic test | 254 | 7.20 | 2004 |
| Built in self test: a complete test solution for telecommunication systems | 17 | 0.88 | 1999 |
