Author Info
Name
Affiliation
Papers
WEI LIN
Institute of Microelectronics, Peking University, Beijing, China
1
Collaborators
Citations 
PageRank 
6
0
0.34
Referers 
Referees 
References 
0
0
0
Title
Citations
PageRank
Year
Toward Reliable Extraction of the Properties of Border Traps in Lateral GaN Power MOSFET with a Distributed Network Model00.342019