Author Info
Name
Affiliation
Papers
YURY ILLARIONOV
TU Wien, Inst Microelect, 27-29 Gusshausstr, A-1040 Vienna, Austria
1
Collaborators
Citations 
PageRank 
6
0
0.34
Referers 
Referees 
References 
0
0
0
Title
Citations
PageRank
Year
Interplay between hot carrier and bias stress components in single-layer double-gated graphene field-effect transistors00.342015