Author Info
Name
Affiliation
Papers
PAUL R. GENSSLER
Chair of Semiconductor Test and Reliability (STAR), University of Stuttgart, Stuttgart, Germany
2
Collaborators
Citations 
PageRank 
7
1
0.71
Referers 
Referees 
References 
8
25
6
Title
Citations
PageRank
Year
Cross-layer FeFET Reliability Modeling for Robust Hyperdimensional Computing00.342022
On the Reliability of FeFET On-Chip Memory10.372022